This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. The book reports systematically the state of the arts and future research directions of those areas. CONDITION â USED: Books sold are in GOOD or better condition. Good Condition: Minimal damage to the cover, dust jacket may not be included, minimal wear to binding, most of the pages undamaged(e.g., minimal creases or tears), highlighting / underlining acceptable on books as long as the text is readable and markings are not excessive, no missing pages. May be a former library book, with usual treatments(e.g., mylar covers, call stickers, stamps, card pockets, barcodes, or remainder marks). Extra components, such as CDs, DVDs, figurines, or access codes are not included. ISBN: 9780863417450 ISBN10: 0863417450 Contributors: Sun, Yichuang,