Springer Proceedings in Physics Microscopy of Semiconducting Materials: Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK, Book 107, (Hardcover)

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Springer Proceedings in Physics Microscopy of Semiconducting Materials: Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK, Book 107, (Hardcover)

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Springer Proceedings in Physics Microscopy of Semiconducting Materials: Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK, Book 107, (Hardcover)
Author: Springer
ISBN: 9783540319146
Format: Hardcover
Publication Date: 2006-04-10
Page Count: 540

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Hardcover
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Non-Fiction
Genre
Textbooks
Publication date
April, 2006
Pages
540
Subgenre
Physics

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The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques were also covered and included the latest work using scanning probe microscopy and also X-ray topography and diffraction.

Springer Proceedings in Physics Microscopy of Semiconducting Materials: Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK, Book 107, (Hardcover)
Author: Springer
ISBN: 9783540319146
Format: Hardcover
Publication Date: 2006-04-10
Page Count: 540

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Textbooks

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April, 2006

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Springer Proceedings in Physics Microscopy of Semiconducting Materials: Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK, Book 107, (Hardcover)

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Similar items you might like

Based on what customers bought

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