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Engineering Materials Transport in Metal-Oxide-Semiconductor Structures: Mobile Ions Effects on the Oxide Properties, (Hardcover)

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Engineering Materials Transport in Metal-Oxide-Semiconductor Structures: Mobile Ions Effects on the Oxide Properties, (Hardcover)

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Engineering Materials Transport in Metal-Oxide-Semiconductor Structures: Mobile Ions Effects on the Oxide Properties, (Hardcover)
Author: Springer
ISBN: 9783642163036
Format: Hardcover
Publication Date: 2011-01-16
Page Count: 106

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Book format
Hardcover
Fiction/nonfiction
Non-Fiction
Genre
Computing & Internet
Publication date
January, 2011
Pages
106
Subgenre
Materials Science

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Reviewing the state-of-the-art in the field, this volume describes the importance of mobile ions presented in oxide structures. The text defines the MOS structure, and provides an overview of onic transport mechanisms and techniques for measuring the mobile ions concentration in the oxides.

Engineering Materials Transport in Metal-Oxide-Semiconductor Structures: Mobile Ions Effects on the Oxide Properties, (Hardcover)
Author: Springer
ISBN: 9783642163036
Format: Hardcover
Publication Date: 2011-01-16
Page Count: 106

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Specifications

Book format

Hardcover

Fiction/nonfiction

Non-Fiction

Genre

Computing & Internet

Publication date

January, 2011

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Engineering Materials Transport in Metal-Oxide-Semiconductor Structures: Mobile Ions Effects on the Oxide Properties, (Hardcover)

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Try 30 days of Walmart+ for just $1!

About this item

Product details

Specifications

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Fiction/nonfiction

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Publication date

Warranty

Warranty information

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Based on what customers bought

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